Novel Photoconductive Decay Measurement System
Richard K. Ahrenkiel and Donald J. Dunlavy
Summary: A nondestructive, contactless means to measure the recombination of lifetime of a
wide range of semiconducting and photoconducting materials
Description: The efficiency and performance of photovoltaic devices are heavily dependent on
the photocarrier recombination lifetime, which itself is highly dependent on impurities and
defects within the photoconducting material. Thus measurement of the photocarrier
recombination lifetime of a sample is a useful quality control measure. This invention provides
a nondestructive, contactless means to measure the recombination of lifetime of a wide range
of semiconducting and photoconducting materials. The device exceeds the performance and
range of applicability of existing commercial products. It utilizes a novel system of radio
frequency coils that allow for a rapid data acquisition time with no contact of the sensitive
photovoltaic material.
Main Advantages of this Invention:
 Fast data acquisition time
 Provides a non-destructive means of
measuring the lifetime of a variety of
materials
 Performance exceeds those of current
methods
 Has a greater range of applicability
than the current method
Potential Areas of Application:
 Photovoltaic industry
 Microelectronic industry
 Optoelectronic industry
ID number: 9001
Comparison of transition-modulated photoconductivity decay
(TMPCD) in this work and resonance coupled photoconductive
Intel ectual Property Status: US 8,581,613
decay (RCPCD) measurements.
Opportunity: We are seeking an exclusive or non-exclusive licensee for marketing,
manufacturing, and sale of this technology.
_________________________________________________________________________________
For more information contact:
William Vaughan, Director of Technology Transfer
Colorado School of Mines, 1500 Illinois Street, Guggenheim Hall Suite 314, Golden, CO 80401
Phone: 303-384-2555; e-mail: wvaughan@mines.edu