RESEARCH INTERESTS IN THE AREA OF SURFACE ANALYSIS

We are using modern analytical methods for understanding surface related problems in catalysis, corrosion, oxide film growth, polymer films, etc. The techniques include x-ray photoelectron spectroscopy (XPS), secondary ion mass spectrometry (SIMS), Auger spectroscopy, fourier transform infrared spectroscopy (FTIR), solid state nuclear magnetic resonance (NMR), BET, chemisorption, and temperature programmed desorption (TPD).

XPS instrument used for Surface Analysis:


Last Updated: 09/01/99