VASE
This is the J.A. Woollam variable angle spectroscopic ellipsometer (VASE) that is used for characterizing the thickness and optical properties of thin films. The instrument collects psi-delta information over a wavelength range of 250-1300 nm at the full range of incident angles (0 – 90). Woollam software applies standard models (Cauchy, Tauc-Lorenz, etc.) to extract wavelength-dependent values of refractive index, absorption coefficient, etc.